Sophisticated Analytical Instrument Facility

Time-of-Flight Secondary Ion Mass Spectrometer (ToF SIMS)


       The Time-of-Flight Secondary Ion Mass Spectrometer (ToF SIMS) is now commissioned at SAIF/RSIC, the first of its kind in India.
       Users are most welcome to make use of this new Facility by following the usual Registration procedures.
       Soild samples, less than 20mmx20mmx20mm, can be accepted. The examination surface and the mounting surface will have to be flat and the samples should be as far as possible free of unwanted contamination.
       Charges will be Rs.4000/- per session. A session lasts 1/2 a day of approximately 3 hours, for Industry, for half a day booking. As usual, University/Educational Institutions will be provided 75% discount and non-profit research organizations will be provided 40% discount on the above indicated charges.
       Users may contact Mr.Subhash Lokhre in the SIMS Laboratory
Tel No: 4675
Email Id : subhashl@iconanalytical.com
Cell: 9320329885 ( if unable to contact on email and/or Tel No. 4675) for sample submission.


The salient features of the ToF SIMS are:
       Time-of-Flight Secondary Ion Mass Spectroscopy (ToF SIMS) is a surface sensitive Spectroscopy that uses a pulsed Primary Ion beam to induce the desorption and ionization of atomic and molecular species from a solid sample surface. The resulting Secondary Ions are accelerated into the Mass Spectrometer where they are mass seperated by measuring the time-of-flight from the sample to the detector and a mass spectrum is recorded. An Image may be generated by rastering a finely focussed Ion beam across the sample surface. A depth profile may be constructed by using an Ion beam to remove sequential layers of material from the surface while acquiring mass spectra at each depth.

Ion Guns: LMIG,Cesium and Gas Ion guns.

Capabilities:
       Analysis of all conducting, Semi Conducting and Insulating solids; Detection of all elements and Isotopes, atomic and molecular species, both organic inorganic; Sensitivities down to parts per billion.

Applications:
       Nanodevices; Polymer blends; Pharmaceuticals; Thin films/surface coatings; corrosion;Catalysis; Geologic materials etc


Contact: 022-25764675                      Email Id : simslab@iitb.ac.in

Sophisticated Analytical Instrument Facility,
IIT-Bombay, Powai, Mumbai-400 076

Tel : 022-25767691/2     Website : http://www.rsic.iitb.ac.in
Fax : 0091-22-25723314     Email : office.saif@iitb.ac.in